Life-Span

Total results returned: 2

Digital Design

Internet of Things (IoT) based Remaining Useful Lifetime (RUL) Estimation of Power Converter with In-situ Junction Temperature Measurement

31% of failures in power electronics are caused by semiconductor switch failure. Semiconductor junction temperature is the most crucial failure stress factor. A Remaining Useful Lifetime (RUL) estimation platform is needed for Prognostic and Health Management of power electronics converters.

Audience:
Digital Design Professionals, Fleet Management Companies, Power Electronic Engineers
Electric Vehicle Operations

Longevity of Electric Vehicle Operations

The article delves into the evolution of battery chemistries, energy densities, and thermal management systems, which collectively impact battery life and overall vehicle longevity.

Audience:
Battery Manufacturers and Suppliers, Electric Vehicle Manufacturers, Electric Vehicle Owners and Consumers, Government and Regulatory Bodies, Researchers